Session: 11D, Wednesday, 27 January 2010, 1330-1530
Moderator: Frank Straka, Andrew Corporation
The session is a combination of analytical reliability and risk modeling techniques, design-reliability cooperation, and test techniques for product reliability achievement and enhancement.
Papers:
11D1 [0158] USING ELECTRONIC DESIGN AUTOMATION TOOLS THROUGHOUT PRODUCT LIFE CYCLE by Bryan Stallard, Mike Silverman, Ops A La Carte
Challenges routinely arise on programs for military, aerospace, telecommunication, and medical that have significant non-recurring engineering (NRE) content and have potentially severe impact on users when failures arise. In this setting, product life cycle (PLC) use of electronic design automation (EDA) tools offers an improved way to address issues in parts obsolescence, pattern failure emergences, parts-counterfeiting eruptions, and qualification of commercial off-the-shelf products.
11D2 [0250] A LIFE CYCLE-BASED SOFTWARE RELIABILITY APPROACH FOR NASA PROJECTS
by Ying Shi, ManTech SRS Technologies, Prince Kalia, John W. Evans, Ph.D., Anthony J. DiVenti, NASA
This paper discusses a life-cycle based software reliability assurance guideline which could be used in future NASA projects. The guideline could provide a success road-map of integrated system risk management from early development phases for timely identification of valued improvement focus tasks and thus help in the informed decision making process throughout the life cycle including successful deployment of the system.
11D3 [0099] RISK INFORMED DESIGN MODELING PROCESS & DESIGN TEAM – ANALYST INTERACTION by Chris Mattenberger, Valador, Inc.
The Altair Lunar Lander has recently completed a Lunar Design Analysis Cycle which employed a Risk Informed Design process utilizing the Valador Reliability Tool. This paper explores the process, techniques, lessons learned, and overall experience of the project from the view point of the lead Risk Analyst.
11D4 [0195] ADVANCEMENTS IN FAILURE DETECTION
by Gregg K. Hobbs, PE, Ph.D., Hobbs Engineering Corp.
A procedure called Modulated Excitation has been developed that has been observed to improve detection by orders of magnitude. The technique will be discussed in detail and some examples given of its use. In the author’s experience, the results are that some 17x as many defects are detected than when the technique is not used. Additionally, the technique has been used on NDF (No Defects Found) field returns with great success and has essentially eliminated the problem of NDFs.
Advanced Reliability Analyses and Measures for Product Reliaility Achievement
Session: 11D, Wednesday, 27 January 2010, 1330-1530
Moderator: Frank Straka, Andrew Corporation
The session is a combination of analytical reliability and risk modeling techniques, design-reliability cooperation, and test techniques for product reliability achievement and enhancement.
Papers:
11D1 [0158] USING ELECTRONIC DESIGN AUTOMATION TOOLS THROUGHOUT PRODUCT LIFE CYCLE by Bryan Stallard, Mike Silverman, Ops A La Carte
Challenges routinely arise on programs for military, aerospace, telecommunication, and medical that have significant non-recurring engineering (NRE) content and have potentially severe impact on users when failures arise. In this setting, product life cycle (PLC) use of electronic design automation (EDA) tools offers an improved way to address issues in parts obsolescence, pattern failure emergences, parts-counterfeiting eruptions, and qualification of commercial off-the-shelf products.
11D2 [0250] A LIFE CYCLE-BASED SOFTWARE RELIABILITY APPROACH FOR NASA PROJECTS
by Ying Shi, ManTech SRS Technologies, Prince Kalia, John W. Evans, Ph.D., Anthony J. DiVenti, NASA
This paper discusses a life-cycle based software reliability assurance guideline which could be used in future NASA projects. The guideline could provide a success road-map of integrated system risk management from early development phases for timely identification of valued improvement focus tasks and thus help in the informed decision making process throughout the life cycle including successful deployment of the system.
11D3 [0099] RISK INFORMED DESIGN MODELING PROCESS & DESIGN TEAM – ANALYST INTERACTION by Chris Mattenberger, Valador, Inc.
The Altair Lunar Lander has recently completed a Lunar Design Analysis Cycle which employed a Risk Informed Design process utilizing the Valador Reliability Tool. This paper explores the process, techniques, lessons learned, and overall experience of the project from the view point of the lead Risk Analyst.
11D4 [0195] ADVANCEMENTS IN FAILURE DETECTION
by Gregg K. Hobbs, PE, Ph.D., Hobbs Engineering Corp.
A procedure called Modulated Excitation has been developed that has been observed to improve detection by orders of magnitude. The technique will be discussed in detail and some examples given of its use. In the author’s experience, the results are that some 17x as many defects are detected than when the technique is not used. Additionally, the technique has been used on NDF (No Defects Found) field returns with great success and has essentially eliminated the problem of NDFs.