Session: 12D, Wednesday, 27 January 2009, 1545-1745 Moderator: Sean Carter, NASA Johnson Space Center
The session compiles advanced reliability assessment techniques as applied to the specific types of modern components and systems including the lead free electronics.
Papers: 12D1 [0005] AN IMPROVED MONTE CARLO METHOD IN FAULT TREE ANALYSIS by Olexandr Yevkin, Ph.D., Dyadem International Ltd Significant improvements of Monte Carlo method are suggested for static and dynamic fault tree analysis. The variance reduction method in combination with other approaches is studied and developed for highly reliable systems. The efficiency and accuracy of the improved method is demonstrated by numerous calculations of most complex industrial benchmarks.
12D2 [0139] ANALYZING FAILURE FREQUENCY AND SEVERITY IN COMMUNICATION NETWORKS by Tatsuya Matsukawa, Nippon Telegraph and Telephone Corporation
Network reliability is a critical requirement for communication network services. In IP networks, the numbers of end users and network elements are greatly increased and the network structure is often changed after services have already been deployed. Therefore, the network availability also has to be monitored and maintained in the operation phase. This paper describes methods and examples of analyzing the failure frequency and severity in communication networks.
12D3 [0020] A GENERAL FRAMEWORK FOR MODELING EQUIPMENT AGING by Joel A. Nachlas, Ph.D., Virginia Tech and C. Richard Cassady, Ph.D., University of Arkansas
Provides general models for distinguishing between clock time and age of equipment in terms of intensity of use and operating environment.
12D4 [0132] RUGGEDNESS AND RELIABILITY OF LEAD-FREE ELECTRONICS by John Starr, CirVibe Inc There is a broad range of ruggedization methods and screening methods used for developing a reliable product – some old, some new – some more effective than others. This paper addresses the increased needs for reliability of emerging technologies such as lead-free.
Advanced Techniques in Reliability Assessment
Session: 12D, Wednesday, 27 January 2009, 1545-1745
Moderator: Sean Carter, NASA Johnson Space Center
The session compiles advanced reliability assessment techniques as applied to the specific types of modern components and systems including the lead free electronics.
Papers:
12D1 [0005] AN IMPROVED MONTE CARLO METHOD IN FAULT TREE ANALYSIS
by Olexandr Yevkin, Ph.D., Dyadem International Ltd
Significant improvements of Monte Carlo method are suggested for static and dynamic fault tree analysis. The variance reduction method in combination with other approaches is studied and developed for highly reliable systems. The efficiency and accuracy of the improved method is demonstrated by numerous calculations of most complex industrial benchmarks.
12D2 [0139] ANALYZING FAILURE FREQUENCY AND SEVERITY IN COMMUNICATION NETWORKS
by Tatsuya Matsukawa, Nippon Telegraph and Telephone Corporation
Network reliability is a critical requirement for communication network services. In IP networks, the numbers of end users and network elements are greatly increased and the network structure is often changed after services have already been deployed. Therefore, the network availability also has to be monitored and maintained in the operation phase. This paper describes methods and examples of analyzing the failure frequency and severity in communication networks.
12D3 [0020] A GENERAL FRAMEWORK FOR MODELING EQUIPMENT AGING
by Joel A. Nachlas, Ph.D., Virginia Tech and C. Richard Cassady, Ph.D., University of Arkansas
Provides general models for distinguishing between clock time and age of equipment in terms of intensity of use and operating environment.
12D4 [0132] RUGGEDNESS AND RELIABILITY OF LEAD-FREE ELECTRONICS
by John Starr, CirVibe Inc
There is a broad range of ruggedization methods and screening methods used for developing a reliable product – some old, some new – some more effective than others. This paper addresses the increased needs for reliability of emerging technologies such as lead-free.