RAMS 2025 Associate Editors

Name Affliation
Syamsundar Annamraju Gayatri Vidya Parishad College of Engineering
Christophe Berenguer Grenoble Institute of Tech
Yizhak Bot BQR Reliability Engineering Ltd.
Arthur Brault BAE Systems
Sri Ganesh Buddhavarapu Wisk Aero
Cristiano Cavalcante Universidade Federal de Pernambuco
Sanjay K Chaturvedi Indian Institute of Technology-Kharagpur
Dongmei Chen STEA – China
Benny Cheng NSWC Corona
Marcel Chevalier Schneider Electric
Abishai Daniel Intel Corporation
James DiCesare Raytheon Technologies
Phuc Do University of Lorraine
Haxel Estavillo Raytheon Technologies
John Evans NASA
Jaime Franqui Raytheon Technologies
Heeralal Gargama Indian Institute of Technology-Kharagpur
Harry Guo Ethicon, Inc.
Myron Hecht Aerospace Corporation
Roohollah Heidary GTC Analytics
Sharon Honecker Raytheon Technologies
Wei Huang Maxar Technologies
Deovrat Kakde SAS Institute Inc.
Ramdev Kanapady University of Minnesota
John Kreucher Reliability Alliance
Edwin Vijay Kumar REAP Engineering GVPCE(A)
Bin Liu University of Strathclyde, UK
Rajesh Mishra Gautam Buddha University
Rahamathulla Mohammad Victoria University
Ananthakrishnan Narayanan Lenovo Inc.
Tim Newman ASC – Collins
Rajiv Nandan Rai Indian Institute of Technology-Kharagpur
Ayswarya Rajagopalan Western Digital Corporation
Emmanuel Remy EDF
Dharmaraja Selvamuthu Indian Institute of Technology-Delhi
Jonathan Soliman NASA/JPL
Miklós Szidarovszky Raytheon Technologies
Sharareh Taghipour Toronto Metropolitan University
María Inmaculada Torres Castro University of Extremadura
Hemant Urdhwareshe Institute of Quality and Reliability
Kalyan Vaidyanathan BAE Systems
Dharmjeet Verma CNH Industrial
Sameer Vittal GE Digital
Wendai Wang Intel Corporation
Qunyong Wang STEA – China
Hongzhou Wang Raytheon Technologies
Min Xie City University of Hong Kong